Spectrum Analyzer Scours 9 kHz To 3 GHz

May 7, 2013
This versatile spectrum analyzer performs a wide range of measurements from 9 kHz to 3 GHz.

Model GA4063 is a flexible and powerful benchtop spectrum analyzer from Saelig Co. for measurements from 9 kHz to 3 GHz. It features an easy-to-use keypad and soft-key control system, with measurements shown on a full-color, 800 x 480-pixel, 8.5-in. thin-film-transistor (TFT) liquid-crystal-display (LCD) screen. It offers resolution-bandwidth filters from 1 Hz to 3 MHz in a 1/3/10 sequence, and can handle input signals as high as +30 dBm (1 W). The analyzer has low phase noise of -95 dBc/Hz offset 10 kHz from the carrier with displayed-average-noise-level (DANL) specification of -130 dBm with the internal preamplifier turned off. The analyzer included programming for a diverse group of automatic measurements, such as channel power, adjacent channel power, harmonic distortion, occupied bandwidth (OBW), third-order intermodulation distortion, and phase noise. Standard popular interfaces, such as USB, LAN, and RS-232 interfaces, are built into the spectrum analyzer. The model GA4063 spectrum analyzer measures 16 x 8 x 7 in. and weighs 15.4 lbs. It is shipped with a user guide, programming manual, and accessories kit. A version with 3-GHz tracking generator is also available.

Saelig Co., 71 Perinton Pkwy., Fairport, NY 14450; (888) 7-SAELIG, (888) 772-3544, (585) 385-1750, FAX: (585) 385-1768, e-mail: [email protected],

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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