The task of testing and characterizing RF/microwave/millimeter-wave devices is growing increasingly more complex and time consuming. These new devices need to be characterized so that statistical models can be developed for sophisticated system and circuit design software. With such software, large portions of lag can be shaved from the design cycle. The models also allow thorough testing for manufacturing/statistical analysis. Because these devices continue to be integrated into smaller, denser packages with higher power densities and additional features, probing by hand is often impractical. To surmount these test challenges and ensure a high quality of model generation, several companies have created software-enhanced test systems. These systems (which are listed below alphabetically according to the company name) provide automation, ease of testing, data analysis, data management, or even model development.
Be sure to also check out "Characterization Softwares For Your RF/Microwave Devices" on Microwaves & RF.
