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Sponsored by National Instruments

If you are an engineer making measurements or performing automated tests on electronic devices, you either work with or will work with RF and microwave measurements. When the time comes to add RF to a test system, it may prove significantly more challenging than adding other measurements of the past. Business challenges can quickly sideline the competitiveness of the wireless capability in your latest device due to cost, rapidly changing commercial standards, and single or limited-protocol instrumentation deployment. This creates the need for more openness in software and more modularity in hardware for RF and microwave instrumentation. To meet this need, National Instruments has redefined the traditional approach. Read the white paper to learn more.