Accel-RF Instruments Corporation, founded in 2003 by two recognized RF and reliability test industry leaders, Roland Shaw and David Sanderlin, is the world leader in supplying equipment for performing high temperature, long-duration reliability testing on compound semiconductors, such as Gallium-Nitride (GaN) and Silicon-Carbide (SiC).
Our platforms are capable of identifying device wear-out and performance degradation to end-of-life (EOL) expectations, usually measured in millions of hours. The test equipment has enabled the successful technology development, product launch, and industry adoption of GaN transistors and MCMs into the space, military, and commercial wireless markets, among others.
Our test equipment has enabled the successful product launch and industry adoption of advanced transistors and integrated-circuits (ICs) into the $35+ billion existing wireless market, and the $100+ billion markets of Military Defense, and Power Electronics.
We specialize in the development, design, and production of accelerated life-test and burn-in test systems for semiconductor devices.
These systems are turnkey integrated instruments that provide a cost-effective and high-value proposition for device manufacturers, fabless device suppliers, testing- service providers, original equipment manufacturers, system integrators, and research and development laboratories requiring intrinsic reliability identification, process-control validation, specification standard-deviation characterization, and product qualification testing.