Software Boosts On-Wafer Test Accuracy

The latest version of the WinCal XE measurement software from Cascade Microtech is written to increase the accuracy of on-wafer RF measurements. The new software version includes hybrid calibrations for multiport measurements, handling as many as four ports; local data manipulation for measurement validation and data analysis; and a host of new device characterization tools. The straightforward software supports a wide range of calibration schemes, including eLRRM, SOLT-eLRRM, SOLT-SOLR, and multiline TRL for comparison to NIST-style reference calibration. For more about the software or Cascade's extensive lines of on-wafer probes and measurement systems, visit the company's website at::

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