How to Survive the Millimeter-Wave Component Test Wave

This seminar will give an overview over challenges and solutions for component level testing at millimeterwave frequencies.

Date: Thursday, December 7, 2017
Time: 2:00 PM ET; 11:00 AM PT
Duration: 60 Minutes

Today, we are at the very beginning of an unprecedented wave of electronic devices that will fundamentally change our everyday life.
For example emerging 5G technologies and autonomous vehicles will have major impact on how we interact with the world and with each other.

In this seminar we will drill down into the component level and analyze how millimeterwave technology will change the way we test and measure the physical components that ultimately enable all future emerging technologies. We will describe the measurement techniques and instruments that are used to perform component level measurements with emphasis on vector network analyzers (VNAs). Specific attention will be given to explaining  how systems requirements drive new test techniques on the production floor. Attendees will leave this seminar with a clear understanding of how they can future proof their skills as well as their T&M infrastructure and how they need to get ready for the next big wave: millimeterwave technology.

Presenter:

Dr. Chris Scholz
Product Manager
Rohde & Schwarz