On-Wafer Measurements Reach As High As 220 GHz

On-Wafer Measurements Reach As High As 220 GHz

(Image courtesy of Anritsu).

The annual International Microwave Symposium (IMS) offers an excellent opportunity to see high-frequency test equipment in action, and not just in the form of images on a company’s website. One of the leaders in RF/microwave signal generators and analyzers, Anritsu Co., will be active at IMS Booth No. 949 showing some of its many test instruments in operation. In-booth demonstrations will include high-power vector-network-analyzer (VNA) measurements and millimeter-wave signal analysis. For those interested in the coming of Fifth Generation (5G) wireless standards and the promise of increase millimeter-wave signal activity, Anritsu personnel will also demonstrate on-wafer device characterization across a mind-boggling total frequency range of 70 kHz to 220 GHz. In addition to various models of VectorStar microwave and millimeter-wave VNAs, the booth will feature a variety of vector signal generators and portable test tools ready to be put to the test. Don’t miss the chance to do some channel scanning with the easy-to-use line of Spectrum Master portable spectrum analyzers, including the 9-kHz-to-4-GHz model MS2712E, which is also capable of phase-noise measurements.

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