Manual Probe System Positioned for THz Testing (.PDF Download)

Practical semiconductor devices at millimeter-wave frequencies will be needed to enable the realization of the many small cells with high-data-rate capacities for Fifth Generation (5G) wireless communications networks. Part of developing those high-frequency, high-speed devices will be testing them during design and development and then in production. The TS150-THZ manual probe system from MPI Corp. has been designed for on-wafer measurements not just through the entire millimeter-wave f

Register to view the full article

By registering on Microwaves & RF now, you'll not only gain access to Wideband Mixer Integrates Programmable IF Amplifiers (.PDF Download), you'll also become part of the RF engineering community. Plus as a bonus you’ll get to a complimentary copy of The Top 5 RF Essentials compendium (PDF download) when you register now.
Joining the Microwaves & RF community also allows you to:

• Become a member of a group of exclusive RF Engineers.
• Start your own conversation by commenting on any article or blog
• Communicate and network with other Engineers from all over the world
• Gain access to download high quality content including schematics and diagrams where applicable.

Hide comments


  • Allowed HTML tags: <em> <strong> <blockquote> <br> <p>

Plain text

  • No HTML tags allowed.
  • Web page addresses and e-mail addresses turn into links automatically.
  • Lines and paragraphs break automatically.