Manual Probe System Positioned for THz Testing (.PDF Download)

Practical semiconductor devices at millimeter-wave frequencies will be needed to enable the realization of the many small cells with high-data-rate capacities for Fifth Generation (5G) wireless communications networks. Part of developing those high-frequency, high-speed devices will be testing them during design and development and then in production. The TS150-THZ manual probe system from MPI Corp. has been designed for on-wafer measurements not just through the entire millimeter-wave f

Register to view the full article

Register to view the full article. By registering for Microwaves & RF now, you'll not only gain access to premium content, you'll also become part of an exclusive, robust global engineering community!
Participate in Expert and Reader driven Q&A's
Start your own conversation by commenting on any article or blog
Download high-quality content including the highly anticipated Salary & Career Report

Hide comments

Comments

  • Allowed HTML tags: <em> <strong> <blockquote> <br> <p>

Plain text

  • No HTML tags allowed.
  • Web page addresses and e-mail addresses turn into links automatically.
  • Lines and paragraphs break automatically.
Publish