Practical semiconductor devices at millimeter-wave frequencies will be needed to enable the realization of the many small cells with high-data-rate capacities for Fifth Generation (5G) wireless communications networks. Part of developing those high-frequency, high-speed devices will be testing them during design and development and then in production. The TS150-THZ manual probe system from MPI Corp. has been designed for on-wafer measurements not just through the entire millimeter-wave f
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