Burdened by the challenge of characterizing the latest devices, engineers are looking for solutions to streamline their test processes, analysis, and data management.
The task of testing and characterizing RF/microwave/millimeter-wave devices is growing increasingly more complex and time consuming. These new devices need to be characterized so that statistical models can be developed for sophisticated system...
This year’s International Microwave Symposium (IMS) had a full schedule of technical presentations, as well as a healthy number of new product introductions at ever-higher frequencies.
This year’s IMS showcased everything from digital-to-analog converters to gallium nitride power amplifiers and everything in between. Click through the gallery to see the latest devices on display for use across microwave and RF markets.