National Instruments will be showcasing new features as part of its RFIC Reference Solution, a hardware and software package for engineers characterizing PAs and Front End Modules (FEMs). In addition to native support for envelope tracking, DPD, and EVM/ACP measurements, new enhancements include extended DPD capabilities and harmonics measurements up to 26.5 GHz.
Additionally, NI will be showcasing the newest features for its Semiconductor Test System (STS), a low-cost, high-throughput PXI alternative to traditional big iron ATE. Originally introduced in August 2014 at NIWeek, the STS now adds enhancements such as 48-port S-parameter measurements and integrated system calibration. Make sure to visit NI at Booth #2431 to see these demos and visit with product experts.