John Barfuss
 Write for Microwaves & RF
4 results found for John Barfuss, displaying items 1 - 4

May 2008   [Test & Measurement]
Eliminate Fixture Effects On Device Measurements
Increased accuracy has been an objective of the earliest vector network analyzer (VNA) measurements. By means of calibration and vectorerror- correction techniques, the accuracy of a VNA can be extended from the instrument ports to the ends of the test cables. When the device under test (DUT) connects directly to the test port cables, the calibration plane and the measurement plane are one and the same. In this case, calibration and error ...

August 2007   [Commercial]
Perfecting Pulsed RF Radar Measurements
Pulsed RF radar signals must be accurately characterized to evaluate a radar system's performance,therefore using the right test tools is vital. Modern radar test instruments,with advances in DSP measurement technology, are able to provide even greater insight than their analog counterparts.The increased performance, flexibility, and functionality of modern instruments are especially useful when evaluating radars that use advanced pulse compression techniques and pulse...

August 9, 2007   [Test & Measurement]
Perfecting Pulsed RF Radar Measurements


July 2003   [Test & Measurement]
Test Spectrum Analyzer ACP Dynamic Range
Spectrum analyzers must deliver wide dynamic range to keep pace with increasingly demanding requirements for evaluating third-generation (3G) wireless systems and their multicarrier power amplifiers (PAs). An analyzer's published...