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[Components]
10-MHz OCXO Increases Test-System Stability

Nancy Friedrich  |  ED Online ID #22902 |  August 2010

TEST-EQUIPMENT PERFORMANCE is typically curtailed by phase noise. To improve the measurement capabilities of phase-noise test sets, signal generators, and spectrum analyzers, the 10-MHz OX-045 oven-controlled crystal oscillator (OCXO) promises to lower close-in phase noise by 10 dB. The OCXO flaunts typical phase noise of –142 dBc/Hz with worstcase performance of –140 dBc/ Hz at an offset of 10 Hz. With an offset of 100 kHz, it boasts typical phase noise of –165 dBc/Hz with a maximum of –163 dBc/Hz. The oscillator runs on a supply voltage of 18 V. It offers temperature stability of ±3 ppb from –0°C to +70°C. The oscillator has an aging rate of 10 ppb/year. It utilizes a low-noise, fifth overtone SC-cut crystal, which is then mated with a proprietary oscillator circuit to minimize any additional noise contributions. The OX-045 consumes 9.0 W during warm-up and 2.0 W during steadystate operation at +25°C.

Vectron International, 267 Lowell Rd., Hudson, NH 03051; (888) 328-7661, FAX: (603) 598-0075, Internet: www.vectron.com.

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