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[Test & Measurement] Improve Those On-Wafer Test Skills Jack Browne | ED Online ID #15880 | June 13, 2007
On-wafer measurements of large-signal, power devices has never been easy. But a webcast offered by Cascade Microtech can make these measurements a bit simpler. Scheduled for Tuesday, June 26th, at 1 PM EST and 10 PM PDT, the webcast will cover high-current probing for DC and pulsed RF measurements, wafer-level safety, and thin-film chuck mounting among other issues. The webcast speaker is Cali Sartor, Senior Product Manager. For more information on the webcast, use the first link below:
Wafer Probing Webcast (https://event.on24.com/eventRegistration/EventLobbyServlet?target=registration.jsp&eventid= 45924&sessionid=1&key=3A256D28B485225C1CA1C1E9725FA2F0&sourcepage=register) Cascade Microtech (www.cmicro.com)
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